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Defect-oriented BIST quality analysis (title)
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book article
Defect-oriented BIST quality analysis
Kruus, Helena
;
Ubar, Raimund-Johannes
;
Raik, Jaan
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 153-156 : ill
book article
Number of records 1, displaying
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keyword
13
1.
defect and failure analysis
2.
functional BIST
3.
hybrid BIST
4.
defect characterization
5.
defect chemistry
6.
defect detection
7.
defect identification
8.
Defect states
9.
defect structure
10.
hann-shaped defect
11.
marginal defect
12.
point defect
13.
surface defect
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