Effect of ultrasonic treatment on the defect structure of the Si-SiO2 system
statement of authorship
D. Kropman, V. Seeman, S. Dolgov, A. Medvids
publisher
journal volume number month
vol. 13, 10-12
year of publication
pages
p. 793 - 797
ISSN
1862-6351
notes
Bibliogr.: 14 ref
scientific publication
teaduspublikatsioon
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inglise
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TTÜ department
Kropman, D., Seeman, V., Dolgov, S., Medvids, A. Effect of ultrasonic treatment on the defect structure of the Si-SiO2 system // Physica Status Solidi (C) Current Topics in Solid State Physics (2016) vol. 13, 10-12, p. 793 - 797.