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Structural fault collapsing by superposition of BDDs for test generation in digital circuits (title)
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book article
Structural fault collapsing by superposition of BDDs for test generation in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA
2010
/
p. 250-257 : ill
https://ieeexplore.ieee.org/document/5450451
book article
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keyword
4
1.
Structural Decision Diagrams for Modeling Digital Circuits
2.
test generation and fault diagnosis
3.
conditional fault collapsing
4.
fault collapsing
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