Structural fault collapsing by superposition of BDDs for test generation in digital circuits
statement of authorship
R. Ubar, D.Mironov, J.Raik, A.Jutman
source
Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA
location of publication
Los Alamitos
publisher
year of publication
pages
p. 250-257 : ill
conference name, date
11th International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010
conference location
San Jose, California USA
ISBN
978-1-4244-6454-8
notes
Bibliogr.: 30 ref
language
inglise
Ubar, R., Mironov, D., Raik, J., Jutman, A. Structural fault collapsing by superposition of BDDs for test generation in digital circuits // Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA. Los Alamitos : IEEE Computer Society Press, 2010. p. 250-257 : ill.