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30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 2012 (source)
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book article
Functional built-in self-test for processor cores in SoC
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
;
Evartson, Teet
;
Orasson, Elmet
30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 2012
2012
/
p. 1-4 : ill
https://ieeexplore.ieee.org/document/6403148
book article
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