Functional built-in self-test for processor cores in SoC
statement of authorship
Raimund Ubar, Viljar Indus, Oliver Kalmend, Teet Evartson, Elmet Orasson
source
30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 2012
location of publication
[S.l.]
publisher
year of publication
pages
p. 1-4 : ill
conference name, date
30th IEEE NORCHIP Conference, November 12-14, 2012
conference location
Copenhagen, Denmark
ISBN
978-1-4673-2223-2
notes
Bibliogr.: 13 ref
language
inglise
Ubar, R., Indus, V., Kalmend, O., Evartson, T., Orasson, E. Functional built-in self-test for processor cores in SoC // 30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 2012. [S.l.] : IEEE Computer Society, 2012. p. 1-4 : ill.