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12551
journal article
"Deeringi" uus niidumasin
Põllumees
1932
/
lk. 291-292 : joon
journal article
12552
journal article
"Deering-Mc Cormik" niidumasina 100 a. juubel 1831-1931
Tehnika Põllumajanduses
1931
/
lk. 45-48 : fot
journal article
12553
book article
Defect analysis of renovated facade walls with etics solutions in cold climate conditions
Liisma, Eneli
;
Sepri, Raili
;
Raado, Lembi-Merike
;
Lill, Irene
;
Witt, Emlyn David Qivitoq
;
Sulakatko, Virgo
;
Põldaru, Mattias
CESB 16 - Central Europe Towards Sustainable Building 2016 : Innovations for Sustainable Future : [book of abstracts]
2016
/
p. 65-66
book article
12554
book article
Defect analysis of renovated facade walls with etics solutions in cold climate conditions [Online resource]
Liisma, Eneli
;
Sepri, Raili
;
Raado, Lembi-Merike
;
Lill, Irene
;
Witt, Emlyn David Qivitoq
;
Sulakatko, Virgo
;
Põldaru, Mattias
CESB 16 - Central Europe Towards Sustainable Building 2016 : Innovations for Sustainable Future : [electronic proceedings]
2016
/
p. 174-181 : ill
book article
12555
book article
Defect oriented fault coverage of 100stuck-at fault test sets
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
2000
/
p. 511-516 : ill
book article
12556
journal article
Defect structure of Cl and Cu doped CdS heat treated in Cd and S2 vapour
Kukk, Peeter-Enn
;
Altosaar, Mare
Journal of solid state chemistry
1983
/
p. 1-11
journal article
12557
journal article
Defect structure of Cu‐doped cadmium selenide
Öpik, Andres
;
Varvas, Jüri
Physica status solidi (a) : applications and materials science
1982
/
p. 467-473 : ill
https://doi.org/10.1002/pssa.2210740212
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article
12558
journal article
Defect structure of silver-doped cadmium telluride
Nirk, Tiit
Tallinna Tehnikaülikooli Toimetised
1994
/
lk. 3-12: ill
journal article
12559
journal article
Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy
Kask, Erkki
;
Grossberg, Maarja
;
Josepson, Raavo
;
Salu, Pille
;
Timmo, Kristi
;
Krustok, Jüri
Materials science in semiconductor processing
2013
/
p. 992-996 : ill
journal article
12560
book article
Defect-oriented BIST quality analysis
Kruus, Helena
;
Ubar, Raimund-Johannes
;
Raik, Jaan
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 153-156 : ill
book article
12561
book article
Defect-oriented fault simulation and test generation in digital circuits
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California
2001
/
p. 365-371
book article
12562
book article
Defect-oriented library builder and hierarchical test generation
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
2001
/
p. 163-168 : ill
book article
12563
journal article
Defect-oriented mixed-level fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
Facta Universitatis [Niš]. Series electronics and energetics
2002
/
1, April, p. 123-136 : ill
journal article
12564
book article
Defect-oriented modul-level fault diagnosis in digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany
2011
/
p. 81-86
book article
12565
book article
Defect-oriented test- and layout-generation for standard-cell ASIC designs
Sudbrock, Joachim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Kuzmicz, Wieslaw
;
Pleskacz, Witold A.
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 79-82 : ill
book article
12566
book article
Defect-oriented test generation and fault simulation in the environment of MOSCITO
Schneider, Andre
;
Diener, Karl-Heinz
;
Gramatova, Elena
;
Fisherova, Maria
;
Ivask, Eero
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
;
Kuzmicz, W.
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 303-306 : ill
book article
12567
book article
Defect-oriented test generation using probabilistic estimation
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 2000
2001
/
p. 131-136 : ill
book article
12568
book article
Defects and their formation processes in non-stoichiometric II-VI compoundes
Erm, Ants
;
Krustok, Jüri
;
Kukk, Peeter-Enn
32nd IUPAC Congress, Stockholm, 2-7 August 1989 : book of abstracts
1989
/
p. 94
https://www.ester.ee/record=b4149424*est
book article
12569
book article
Defects in CdTe-based photodetectors
Valdna, Vello
Materials Research Society Symposia proceedings series
2000
/
p. 241-246 : ill
book article
12570
book article
Defects in chlorine doped CdTe thin films
Valdna, Vello
;
Hiie, Jaan
;
Gavrilov, Aleksei
Abstracts POLYSE
2000
/
p. 36
book article
12571
journal article
Defects in chlorine-doped CdTe thin films
Valdna, Vello
;
Hiie, Jaan
;
Gavrilov, Aleksei
Solid state phenomena
2001
/
p. 155-160 : ill
journal article
12572
book article
Defects in Cl and Na doped CdTe monograin powders
Altosaar, Mare
;
Kukk, Peeter-Enn
;
Raudoja, Jaan
;
Mellikov, Enn
E-MRS Spring Meeting : Strasbourg, 1999 : abstracts
1999
/
p. O-32
book article
12573
book article
Defects, faults and fault models
Gramatova, Elena
;
Fisherova, Maria
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
Handbook of testing electronic systems
2005
/
p. 26-96 : ill
book article
12574
book
Defektide ja rikete seoste analüüs : lepingu Lep16039 aruanne [Võrguväljaanne]
Palu, Ivo
;
Keel, Matti
;
Tammoja, Heiki
2016
https://www.elektrilevi.ee/-/doc/6305157/ettevottest/defektide_rikete_aruanne.pdf
book
12575
book article
Defektide tasakaalu kinnikülmutamise arvutamine tsinksulfiidis
Lott, Kalju
;
Türn, Leo
XXIII Eesti keemiapäevad : teaduskonverentsi ettekannete referaadid
1997
/
lk. 71
book article
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