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2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings (source)
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book article
New fault models and self-test generation for microprocessors using High-Level Decision Diagrams
Jasnetski, Artjom
;
Raik, Jaan
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 251-254 : ill
book article
2
book article
NoCDepend : a flexible and scalable dependability technique for 3D networks-on-chip
Hollstein, Thomas
;
Azad, Siavoosh Payandeh
;
Kogge, Thilo
;
Ying, Haoyuan
;
Hofmann, Klaus
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 75-78 : ill
http://dx.doi.org/10.1109/DDECS.2015.30
book article
3
book article
SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 223-228 : ill
book article
4
book article
SystemC-based loose models for simulation speed-up by abstraction of RTL IP cores
Abrar, Syed Saif
;
Jenihhin, Maksim
;
Raik, Jaan
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 71-74 : ill
http://dx.doi.org/10.1109/DDECS.2015.39
book article
Number of records 4, displaying
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1.
EDUCON 2015, teaduskonverents (2015 : Tallinn)
2.
International Baltic conference on engineering materials and tribology (24 : 2015 : Tallinn)
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