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21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings (source)
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book article
QoSinNoC: analysis of QoS-aware NoC architectures for mixed-criticality applications
Avramenko, Serhiy
;
Azad, Siavoosh Payandeh
;
Niazmand, Behrad
;
Raik, Jaan
;
Jenihhin, Maksim
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 67-72 : ill
https://doi.org/10.1109/DDECS.2018.00-10
book article
2
book article
Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells
Azad, Siavoosh Payandeh
;
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 21-26 : ill
https://doi.org/10.1109/DDECS.2018.00011
book article
3
book article
Software-level TMR approach for on-board data processing in space applications
Janson, Karl
;
Treudler, Carl Johann
;
Hollstein, Thomas
;
Raik, Jaan
;
Jenihhin, Maksim
;
Fey, Goerschwin
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 147-152 : ill
https://doi.org/10.1109/DDECS.2018.00033
book article
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