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Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells

author
statement of authorship
Siavoosh Payandeh Azad, Adeboye Stephen Oyeniran, Raimund Ubar
source
location of publication
Piscataway
publisher
year of publication
pages
p. 21-26 : ill
conference name, date
2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 25-27 April, 2018
conference location
Budapest, Hungary
url
ISSN
2473-2117
ISBN
978-1-5386-5754-6
notes
Bibliogr.: 21 ref
TTÜ department
language
inglise
subject term
subject of form
keyword
two-dimensional array testing
multiplier test
data-controlled circuit partition
test replication
built-in self-test
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Azad, S.P., Oyeniran, A.S., Ubar, R. Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells // 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings. Piscataway : IEEE, 2018. p. 21-26 : ill. https://doi.org/10.1109/DDECS.2018.00011