Searching - TalTech Research Portal

Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement (title)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publications ..

year

year of publication

Loading..

Loading..

TalTech department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

export all inquiry results (1)
Save TXT fail

print
Open for editing with marked entries my bookmarks

display

sort
1

journal article

Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvementBlyzniuk, M.; Kazymyra, I.; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2001 / p. 2023-2040 : ill https://www.sciencedirect.com/science/article/pii/S0026271401000920

journal article

Number of records 1, displaying 1 - 1