Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement

statement of authorship
M.Blyzniuk, I.Kazymyra, W.Kuzmicz, W.A.Pleskacz, J.Raik, R.Ubar
journal volume number month
Vol. 41
year of publication
pages
p. 2023-2040 : ill
ISSN
0026-2714
notes
Bibliogr.: 31 ref
language
inglise
Blyzniuk, M., Kazymyra, I., Kuzmicz, W., Pleskacz, W.A., Raik, J., Ubar, R.-J. Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement // Microelectronics reliability (2001) Vol. 41, p. 2023-2040 : ill. https://www.sciencedirect.com/science/article/pii/S0026271401000920