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Comparative ellipsometric and ion beam analytical studies on ion beam crystallized silicon implanted with Zn and Pb ions (title)

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Comparative ellipsometric and ion beam analytical studies on ion beam crystallized silicon implanted with Zn and Pb ionsLohner, Tivador; Angelov, Christo; Mikli, ValdekThin solid films2008 / 22, p. 8009-8012 https://www.sciencedirect.com/science/article/pii/S0040609008003660

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