Searching - TalTech Research Portal

Design-for-destability-based external test and diagnosis of mesh-like network- on-a-chips (title)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publications ..

year

year of publication

Loading..

Loading..

TalTech department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

export all inquiry results (1)
Save TXT fail

Save PDF fail

print
Open for editing with marked entries my bookmarks

display

sort
1

journal article

Design-for-destability-based external test and diagnosis of mesh-like network- on-a-chipsRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIET computers and digital techniques2009 / 5, p. 476-486 : ill http://dx.doi.org/10.1049/iet-cdt.2008.0096

journal article

Number of records 1, displaying 1 - 1