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Machine learning enabled fault-detection algorithms for optical spectrum-as-a-service users (title)
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book article
Machine learning enabled fault-detection algorithms for optical spectrum-as-a-service users
Patri, Sai Kireet
;
Dick, Isabella
;
Kaeval, Kaida
;
Müller, Jasper
;
Pedreno-Manresa, Jose-Juan
;
Autenrieth, Achim
;
Elbers, Jörg-Peter
;
Tikas, Marko
;
Mas-Machuca, Carmen
2023 International Conference on Optical Network Design and Modeling (ONDM) : proceedings
2023
/
6 p. : ill
https://ieeexplore.ieee.org/document/10144858
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keyword
6
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optical spectrum as a service
2.
optical spectrum-as-a-service
3.
machine learning algorithms
4.
spectrum-based fault localization
5.
BIM-enabled learning
6.
BIM-enabled learning environment
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