Proceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 1983 (source)

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  • book article
    Test pattern generation for microprocessor systems on the alternative graph modelUbar, Raimund-JohannesProceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 19831985 / p. 403-410
    book article
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