Test pattern generation for microprocessor systems on the alternative graph model
author
statement of authorship
Ubar, R.
source
Proceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 1983
location of publication
Budapest
publisher
year of publication
pages
p. 403-410
conference name, date
3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), October 3 - 5, 1983
conference location
Moscow, Russia
subject term
TTÜ department
language
inglise
Ubar, R. Test pattern generation for microprocessor systems on the alternative graph model // Proceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 1983. Budapest : IMEKO, 1985. p. 403-410.