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Journal of Shanghai Normal University : Natural Sciences (source)
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journal article
An approach for verification assertions reuse 2 in RTL test pattern generation
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
;
Fujiwara, Hideo
Journal of Shanghai Normal University : Natural Sciences
2010
/
p. 441-447 : ill
https://www.researchgate.net/publication/240613999_An_Approach_for_Verification_Assertions_Reuse_in_RTL_Test_Pattern_Generation
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keyword
14
1.
natural sciences
2.
Shanghai World Expo
3.
normal
4.
normal and A-reversible matrices
5.
normal boiling point
6.
normal forms
7.
normal series-to-series matrices
8.
normal torsion theory
9.
observer normal forms
10.
off-normal events
11.
post normal science
12.
post-normal science
13.
skew and normal monoidal
14.
standard climate normal
subject term
2
1.
EXPO 2010 (Shanghai)
2.
Shanghai
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