An approach for verification assertions reuse 2 in RTL test pattern generation
statement of authorship
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Taavi Viilukas, Hideo Fujiwara
source
Journal of Shanghai Normal University : Natural Sciences
journal volume number month
Vol. 39, No. 5
year of publication
pages
p. 441-447 : ill
conference name, date
IEEE Eleventh Workshop on RTL and High Level Testing, 5-6 December 2010
conference location
Shangai
subject term
ISSN
1000-5137
notes
Bibliogr.: 25 ref
Kokkuvõte hiina keeles
language
inglise
Jenihhin, M., Raik, J., Ubar, R., Viilukas, T., Fujiwara, H. An approach for verification assertions reuse 2 in RTL test pattern generation // Journal of Shanghai Normal University : Natural Sciences (2010) Vol. 39, No. 5, p. 441-447 : ill.