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From virtual characterization to test-chips : DFM analysis through pattern enumeration (title)

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From virtual characterization to test-chips : DFM analysis through pattern enumerationMartins, Mayler G.A.; Pagliarini, Samuel Nascimento; Isgenc, Mehmet Meric; Pileggi, LarryIEEE transactions on computer-aided design of integrated circuits and systems2020 / p. 520-532 https://doi.org//10.1109/TCAD.2018.2889772

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