Viilukas, T., Karputkin, A., Raik, J., Jenihhin, M., Ubar, R., Fujiwara, H.

Identifying untestable faults in sequential circuits using test path constraints

author

Viilukas, Taavi

Karputkin, Anton

Raik, Jaan

Jenihhin, Maksim

Ubar, Raimund-Johannes

Fujiwara, Hideo

statement of authorship

Taavi Viilukas, Anton Karputkin, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Hideo Fujiwara

source

Journal of electronic testing : theory and applications (JETTA)

journal volume number month

Vol. 28, 4

year of publication

2012

pages

p. 511-521 : ill

keyword

automated test pattern generation

untestable faults

ISSN

0923-8174

notes

Bibliogr.: 23 ref

language

inglise

Viilukas, T., Karputkin, A., Raik, J., Jenihhin, M., Ubar, R., Fujiwara, H. Identifying untestable faults in sequential circuits using test path constraints // Journal of electronic testing : theory and applications (JETTA) (2012) Vol. 28, 4, p. 511-521 : ill.