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2023 IEEE 24th Latin American Test Symposium (LATS) (source)

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book article

Analyzing side-channel attack vulnerabilities at RTLLai, Xinhui; Jenihhin, Maksim2023 IEEE 24th Latin American Test Symposium (LATS)2023 / 2 p. : ill https://doi.org/10.1109/LATS58125.2023.10154497

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