Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
Hantson, Hanno (TTÜ author)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
10
Look more..
(3/24)
Export
export all inquiry results
(10)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
journal article
Automated design error debug using high-level decision diagrams and mutation operators
Raik, Jaan
;
Repinski, Urmas
;
Tšepurov, Anton
;
Hantson, Hanno
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
Microprocessors and microsystems
2013
/
p. 505-513 : ill
journal article
2
journal article
Automated design error localization in RTL designs
Jenihhin, Maksim
;
Tšepurov, Anton
;
Tihhomirov, Valentin
;
Raik, Jaan
;
Hantson, Hanno
;
Ubar, Raimund-Johannes
;
Bartsch, Günter
;
Meza Escobar, Jorge Hernan
;
Wuttke, Heinz-Dietrich
IEEE design & test of computers
2014
/
p. 83-92 : ill
http://dx.doi.org/10.1109/MDAT.2013.2271420
journal article
3
book article
Combining dynamic slicing and mutation operators for ESL correction
Repinski, Urmas
;
Hantson, Hanno
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France
2012
/
[6] p. : ill
https://ieeexplore.ieee.org/document/6233020
book article
4
book article
Design error repair with mutations at higher abstraction levels
Hantson, Hanno
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa
2012
/
p. 21-24 : ill
book article
5
book article
Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis
Hantson, Hanno
;
Repinski, Urmas
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador
2012
/
[6 p.] : ill
https://ieeexplore.ieee.org/document/6261234
book article
6
book article
Mutation analysis for systemC designs at TLM
Guarnieri, Valerio
;
Bombieri, Nicola
;
Pravadelli, Graziano
;
Fummi, Franco
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
12th IEEE Latin American Test Workshop (LATW) : Porto de Galinhas, Brasil, 27-30 March 2011
2011
/
[6] p
book article
7
book article
Mutation analysis with high-level decision diagrams
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
;
Guglielmo, Giuseppe di
;
Fummi, Franco
LATW2010 : 11th Latin-American TestWorkshop, March 28-31, 2010, Punta del Este, Uruguay
2010
/
[6] p. [CD-ROM]
https://ieeexplore.ieee.org/document/5550336
book article
8
dissertation
Mutation-based verification and error correction in high-level designs = Mutatsioonidel põhinev verifitseerimine ja vigade parandamine kõrgtaseme skeemides
Hantson, Hanno
2015
https://www.ester.ee/record=b4518212*est
dissertation
9
book article
Mutations for testing hardware and correcting design errors
Hantson, Hanno
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve
2011
/
p. 105-108 : ill
book article
10
journal article
On the reuse of TLM mutation analysis at RTL
Guarnieri, Valerio
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2012
/
p. 435-448 : ill
journal article
Number of records 10, displaying
1 - 10
author
15
1.
Hantson, Hanno
2.
Hanno
3.
Kase, Hanno
4.
Kask, Hanno
5.
Lindpere, Hanno
6.
Ohvril, Hanno
7.
Ojalo, Hanno
8.
Rohtla, Hanno
9.
Saks, Hanno
10.
Sillamaa, Hanno
11.
Soans, Hanno
12.
Särg, Hanno
13.
Talving, Hanno
14.
Tomberg, Hanno
15.
Vapris, Hanno
name of the person
5
1.
Hantson, Hanno
2.
Kompus, Hanno, 1890-1974
3.
Septer, Hanno
4.
Sillamaa, Hanno, 1929-2004
5.
Tomberg, Hanno
CV
4
1.
Hantson, Hanno 1982
2.
Rohtla, Hanno 1954
3.
Sillamaa, Hanno 1929-2004
4.
Vapris, Hanno 1939-2001
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT