Mutation analysis for systemC designs at TLM
author
statement of authorship
Valerio Guarnieri, Nicola Bombieri, Graziano Pravadelli, Franco Fummi, Hanno Hantson, Jaan Raik, Maksim Jenihhin, Raimund Ubar
source
12th IEEE Latin American Test Workshop (LATW) : Porto de Galinhas, Brasil, 27-30 March 2011
location of publication
[S.l.]
publisher
year of publication
pages
[6] p
conference name, date
12th IEEE Latin American Test Workshop (LATW), 27-30 March 2011
conference location
Porto de Galinhas, Brasil
ISBN
978-1-4577-1489-4
notes
Bibliogr.: 14 ref
language
inglise
subject term
keyword
Guarnieri, V., Bombieri, N., Pravadelli, G., Fummi, F., Hantson, H., Raik, J., Jenihhin, M., Ubar, R. Mutation analysis for systemC designs at TLM // 12th IEEE Latin American Test Workshop (LATW) : Porto de Galinhas, Brasil, 27-30 March 2011. [S.l.] : IEEE, 2011. [6] p.