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2024 IEEE 33rd Asian Test Symposium (ATS) (source)

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book article EST / book article ENG

FORTUNE: A Negative Memory Overhead Hardware-Agnostic Fault TOleRance TechniqUe in DNNsNazari, Samira; Taheri, Mahdi; Azarpeyvand, Ali; Afsharchi, Mohsen; Ghasempouri, Tara; Herglotz, Christian; Daneshtalab, Masoud; Jenihhin, Maksim2024 IEEE 33rd Asian Test Symposium (ATS)2024 / p. 1-6 : ill https://doi.org//10.1109/ATS64447.2024.10915463 Conference proceedings at Scopus Article at Scopus Article at WOS

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