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Influence of annealing in H2 atmosphere on the electrical properties of thin film CdSMaticiuc, Natalia; Hiie, Jaan; Potlog, Tamara; Valdna, Vello; Gavrilov, AlekseiMRS proceedings2011 / p. d14-05

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202

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Influence of copper and oxygen on the optoelectronic properties of chlorine doped CdTe fhin filmsValdna, VelloThin solid films2001 / p. 192-194 : ill

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203

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Influence of copper and oxygen on the optoelectronic properties of chlorine doped CdTe thin filmsValdna, VelloAbstracts E-MRS-IUMRS2000 / p. N-22

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204

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Influence of Cu2S, SnS and Cu2ZnSnSe4 on optical properties of Cu2ZnSnS4Mamedov, D.; Klopov, Mihhail; Karazhanov, S. Zh.Materials letters2017 / p. 70-72 : ill https://doi.org/10.1016/j.matlet.2017.05.069 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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205

book article

Influence of PH on the hydroxide impurities in chemically deposited CDS thin filmÜürike, Marvin; Maticiuc, Natalia; Volobujeva, Olga; Spalatu, Nicolae; Hiie, JaanThe 14th International Conference of Young Scientists on Energy Issues : Kaunas, Lithuania, May 25-26, 20172017 / p. X-316 - X-323 : ill http://cyseni.com/archives/proceedings/Proceedings_of_CYSENI_2017.pdf

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206

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Influence of post-UV/ozone treatment of ultrasonic-sprayed zirconium oxide dielectric films for a low-temperature oxide thin film transistorOluwabi, Abayomi Titilope; Gaspar, Diana; Katerski, Atanas; Mere, Arvo; Krunks, Malle; Pereira, Luis; Oja Acik, IlonaMaterials2020 / art. 6, 14 p. : ill https://doi.org/10.3390/ma13010006 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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207

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Influence of second-order lines on the quantitative wavelength dispersive spectrometry analysis at low accelerating voltagesMikli, ValdekMicrochimica acta2006 / 1/2, p. 205-208 https://link.springer.com/content/pdf/10.1007/s00604-006-0544-7.pdf

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208

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Influence of selenous acid microadditive on electrochemical formation of CdS thin filmsMaricheva, Jelena; Bereznev, Sergei; Maticiuc, Natalia; Volobujeva, Olga; Kois, JuliaElectrochimica acta2017 / p. 280-286 : ill https://doi.org/10.1016/j.electacta.2017.05.035 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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209

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Influence of solution composition on sprayed ZnO nanorods properties and formation process: Thermoanalytical study of the precursorsDedova, Tatjana; Oja Acik, Ilona; Polivtseva, Svetlana; Krunks, Malle; Gromõko, Inga; Tõnsuaadu, Kaia; Mere, ArvoCeramics international2019 / p. 2887-2892 : ill https://doi.org/10.1016/j.ceramint.2018.07.274 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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210

book article

Influence of technological conditions on the properties of CBD CdS layersMaticiuc, Natalia; Hiie, Jaan; Potlog, TamaraCAS 2012 proceedings. Volume 1 : 2012 International Semiconductor Conference : October 15-17, Sinaia, Romania2012 / p. 187-190 : ill https://ibn.idsi.md/vizualizare_articol/192476

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211

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Influence of the copper content on the optical properties of CZTSe thin filmsYakushev, M. V.; Sulimov, M. A.; Marquez-Prieto, J.; Forbes, I.; Krustok, JüriSolar energy materials and solar cells2017 / p. 69-77 : ill https://doi.org/10.1016/j.solmat.2017.04.022 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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212

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Influence of the secondary thermal annealing on the properties of CdTe/CdS:CdCl2:O2 structureYang, Wangjun; Spalatu, Nicolae; Maticiuc, Natalia; Krunks, Malle; Hiie, JaanProceedings of 13th International Conference of Young Scientists on Energy Issues : CYSENI 2016 : May 26-27 2016, Kaunas, Lithuania2016 / p. VII-220 - VII-225 : ill

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213

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Influence of vapour transport deposition conditions on properties of SB2SE3 thin film absorber and solar cellsGopi, Sajeesh Vadakkedath; Spalatu, Nicolae; Katerski, Atanas; Krunks, Malle; Oja Acik, IlonaGraduate School of Functional Materials and Technology (GSFMT) Scientific Conference : abstracts2022 / 18 l. Graduate School of Functional Materials and Technology (GSFMT) Scientific Conference 2022

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214

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In(OH)xSy thin films by chemical bath depositionDedova, Tatjana; Krunks, MalleConference on Knowledge-based Materials and Technologies for Sustainable Chemistry : 1-5 June 2005, Tallinn, Estonia : abstract book2005 / p. 82

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215

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In(OH)xSy õhukesed kiled keemilise vanni meetodilDedova, Tatjana; Krunks, MalleXXIX Eesti keemiapäevad : teaduskonverentsi ettekannete teesid = 29th Estonian Chemistry Days : abstracts of scientific conference2005 / lk. 8

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216

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Insights into TiO2 thin film photodegradation from Kelvin Probe AFM mapsOlukan, Tuza; Sydorenko, Jekaterina; Katerski, Atanas; Al Mahri, Mariam; Lai, Chia-Yun; Al-Hagri, Abdulrahman; Santos, Sergio; Chiesa, MatteoApplied physics letters2022 / art. 031901 https://doi.org/10.1063/5.0098788 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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217

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In-situ characterization of the polypyrrole films by EQCM and CER techniquesSõritski, Vitali; Öpik, Andres; Talo, A.; Forsen, OlofSynthetic metals2001 / 1/3, p. 309-310 : ill https://www.researchgate.net/publication/202179222_In-situ_characterization_of_the_polypyrrole_films_by_EQCM_and_CER_techniques

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218

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In-situ study of TiO2 thin-films mechanical behavior under loadingLõhmus, Rünno; Hussainova, Irina; Leinberg, Silver; Aarik, Jaan; Tarre, Aivar; Lõhmus, AntsProceedings of Material Research Society Spring Meeting : April 9-13, 2007, San Francisco, CA, USA2007 / ? p

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219

book article

Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface propertiesKropman, Daniel; Kärner, Tiit; Dolgov, Sergei; Heinmaa, Ivo; Laas, Tõnu; Londos, C. A.The 9th International Conference on Global Research and Education : August 9-12, 2010, Riga : digest2010 / p. 231-233 https://www.sciencedirect.com/science/article/abs/pii/S0040609009014564

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220

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Interaction of point defects with impurities in the Si-SiO2 system and its influence on the properties of the interfaceKropman, Daniel; Mellikov, Enn; Lott, Kalju; Kärner, T.; Heinmaa, I.Getterring and defect engineering in semiconductor technology XIII : CADEST 2009 : proceedings of the XIIIth International Autumn Meeting, Döllnsee-Schorfheide, north of Berlin, Germany, September 26 - October 02, 20092010 / p. 145-148 : ill https://www.sciencedirect.com/science/article/abs/pii/S0040609009014564

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221

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Interaction of point defects with impurities in the Si-SiO2 system and its influence on the properties of the interfaceKropman, Daniel; Mellikov, Enn; Lott, Kalju; Kärner, T.; Heinmaa, I.; Laas, Tõnu; Medvid, A.; Skroupa, W.; Prucnal, S.; Zvyagin, S.; Cizmar, E.; Ozerov, M.; Wosnitsa, J.Solid state phenomena2010 / p. 145-148 : ill https://www.sciencedirect.com/science/article/abs/pii/S0040609009014564

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222

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Interaction of point defects with impurities in the Si-SiO2 system and its influence on the properties of the interfaceKropman, Daniel; Mellikov, Enn; Öpik, Andres; Lott, Kalju; Kärner, T.; Heinmaa, I.; Laas, Tõnu; Medvid, A.; Skroupa, W.; Prucnal, S.; Rebohle, L.; Zvyagin, S.; Cizmar, E.; Ozerov, M.; Wosnitsa, J.Thin solid films2010 / 9, p. 2374-2376 https://www.sciencedirect.com/science/article/abs/pii/S0040609009014564

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223

book article

Investigation of electrical properties of cadmium sulfide thin filmsGraf, AleksandrProceedings of CYSENI 2013 : the 10th Annual Conference of Young Scientists on Energy Issues, May 29-31, 2013, Kaunas, Lithuania2013 / p. 457-463

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224

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Investigation of morphology changes on nanocrystalline diamond film surfaces during reciprocating sliding against Si3N4 ballsBogatov, Andrei; Podgurski, Vitali; Raadik, Taavi; Kamjula, A. R.; Hantschel, Thomas; Tsigkourakos, M.; Kulu, PriitEngineering materials & tribology XXII2014 / p. 126-129 https://doi.org/10.4028/www.scientific.net/KEM.604.126 Conference proceedings at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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225

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Investigation of sprayed thin films on glass substrates by X-ray microanalysisMikli, Valdek; Krunks, MalleAbstracts of International Conference on X-ray Optics and Microanalysis2001 / p. 117

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