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Advanced microelectronics ; 17 (series)
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book article
An approach to system-level design for test
Jervan, Gert
;
Ubar, Raimund-Johannes
;
Peng, Z.
;
Eles, Petru
System-level test and validation of hardware/software systems
2005
/
p. 121-149 : ill
book article
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keyword
33
1.
high-temperature microelectronics
2.
acid yellow 17
3.
group 17 compounds
4.
17 alpha estradiol
5.
17–4 PH stainless steel
6.
advanced abutment pressure
7.
Advanced Along-Track Scanning Radiometer (AATSR)
8.
advanced calculation
9.
advanced characterization
10.
advanced control
11.
advanced driver assistance system
12.
Advanced Driver Assistance Systems (ADAS)
13.
advanced encryption standard
14.
advanced encryption standard (AES)
15.
advanced fiber placement technology
16.
advanced fibre placement technology
17.
advanced glycation
18.
advanced hepatocellular carcinoma
19.
advanced manufacturing
20.
advanced manufacturing environment
21.
advanced material
22.
advanced measurement infrastructure
23.
advanced oxidation
24.
advanced oxidation process
25.
advanced oxidation process (AOP)
26.
advanced oxidation processes
27.
advanced oxidation processes (AOPs)
28.
advanced programming and software
29.
advanced thermal management
30.
advanced training
31.
advanced user interface
32.
locally advanced breast cancer
33.
locally advanced melanoma and sarcoma
subject term
3
1.
Robotex (17 : 2017 : Tallinn)
2.
Tallinna Polütehniline Instituut. Üliõpilaste teaduslik konverents (17 : 1962)
3.
17. sajand
name of the person
1
1.
Serra, Antonio, 16-17. saj
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