Searching - TalTech Research Portal

Complex simulation of punchthrough, tunneling and high-speed characteristics of scaled bipolar devices and circuits (title)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publications ..

year

year of publication

Loading..

Loading..

TalTech department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

export all inquiry results (1)
Save TXT fail

print
Open for editing with marked entries my bookmarks

display

sort
1

book article

Complex simulation of punchthrough, tunneling and high-speed characteristics of scaled bipolar devices and circuitsBubennikov, Alexander N.; Ishevsky, D.V.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 26-31: ill https://www.ester.ee/record=b1064031*est

book article

Number of records 1, displaying 1 - 1