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ETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 1993 (source)
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book article
Functional level testability analysis for digital circuits
Ubar, Raimund-Johannes
;
Kuchcinski, Ktzysztof
ETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 1993
1993
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p. 545-546
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