Calculation of testability measures on structurally synthesized binary decision diagrams (title)

types of item

  • book article
    Calculation of testability measures on structurally synthesized binary decision diagramsUbar, Raimund-Johannes; Heinlaid, J.; Raik, Jaan; Raun, L.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 179-182: ill
    book article
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