Ubar, R., Heinlaid, J., Raik, J., Raun, L.

Calculation of testability measures on structurally synthesized binary decision diagrams

author

Ubar, Raimund-Johannes

Heinlaid, J.

Raik, Jaan

Raun, L.

statement of authorship

R.Ubar, J.Heinlaid, J.Raik, L.Raun

source

BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings

location of publication

[Tallinn]

year of publication

1998

pages

p. 179-182: ill

ISBN

9985-59-081-3

notes

Bibl. 13 ref

Ubar, R., Heinlaid, J., Raik, J., Raun, L. Calculation of testability measures on structurally synthesized binary decision diagrams // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 179-182: ill.