Ubar, R., Heinlaid, J., Raik, J., Raun, L.

full record print

Calculation of testability measures on structurally synthesized binary decision diagrams

author

Ubar, Raimund-Johannes

Heinlaid, J.

Raik, Jaan

Raun, L.

statement of authorship

R.Ubar, J.Heinlaid, J.Raik, L.Raun

source

BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings

location of publication

[Tallinn]

year of publication

1998

pages

p. 179-182: ill

ISBN

9985-59-081-3

notes

Bibl. 13 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

digitaalelektroonika

testimine

otsustusdiagrammid

Ubar, R., Heinlaid, J., Raik, J., Raun, L. Calculation of testability measures on structurally synthesized binary decision diagrams // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 179-182: ill.