Greedy alternative for the static compaction of sequential circuit test sequences (title)

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  • book article
    Greedy alternative for the static compaction of sequential circuit test sequencesRaik, JaanThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 133-136 : ill
    book article
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