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[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 2 (source)

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Design error localization in digital circuits by stuck-at fault test patternsJutman, Artur; Ubar, Raimund-Johannes[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 22000 / p. 723-726 https://ieeexplore.ieee.org/document/838792

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