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Electron Devices Society (publisher)
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book article
Design error localization in digital circuits by stuck-at fault test patterns
Jutman, Artur
;
Ubar, Raimund-Johannes
[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 2
2000
/
p. 723-726
https://ieeexplore.ieee.org/document/838792
book article
Number of records 1, displaying
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keyword
88
1.
Auger electron spectroscopy
2.
electron
3.
electron backscatter diffraction (EBSD)
4.
electron backscattered diffraction analysis
5.
electron beam induced current
6.
electron beam melting
7.
Electron beams
8.
electron density measurement
9.
electron donor number
10.
electron donor-acceptor complex
11.
electron guns
12.
electron holography
13.
electron irradiation
14.
electron linear accelerator
15.
electron microscopeGrain sizeHolocene Thermal MaximumBaltic SeaGulf of Riga
16.
electron microscopy
17.
electron phonon interaction
18.
electron tomography
19.
electron transport layer
20.
electron transport layers
21.
electron transporting materials
22.
electron-phonon interaction
23.
lone pair electron
24.
scanning electron microscope
25.
scanning electron microscopy
26.
selective electron beam melting
27.
single electron transfer
28.
TiO2 electron transport layer
29.
transmission electron microscopy
30.
acoustic devices
31.
bi-directional fault monitoring devices
32.
biomedical devices
33.
cardiac implantable electronic devices
34.
cardiac implanted electronic devices
35.
chirality devices
36.
configurable protection devices
37.
constrained devices
38.
devices for energy harvesting
39.
electronic devices
40.
embedded devices
41.
energy storage devices
42.
FACTs devices
43.
GaAs power devices
44.
homecare medical devices
45.
implanted devices
46.
In vitro diagnostic medical devices
47.
intelligent electronic devices
48.
lab-on-chip devices
49.
medical devices
50.
microfluidic devices
51.
miniaturized devices
52.
on-scene available devices
53.
peripheral devices
54.
power devices
55.
power semiconductor devices
56.
resource-constrained devices
57.
semiconductor devices
58.
series Protection devices
59.
smart autonomous devices
60.
smart devices
61.
testing of digital devices
62.
thermoelectric devices
63.
wearable devices
64.
wide band gap semiconductor devices
65.
ageing society
66.
civil society
67.
civil-society
68.
Community Statistics on Information Society (CSIS)
69.
digital economy and society index (DESI)
70.
digital society
71.
energy and society
72.
European Society of Cardiology
73.
European Society of hypertension
74.
harmony society
75.
Ict and society
76.
information society
77.
innovative society
78.
Internet society
79.
law and society
80.
logic in society
81.
open society
82.
science-policy-society interface
83.
society
84.
Society 5.0
85.
society-in-the-loop framework
86.
stateless society
87.
The International Society For Engineering Pedagogy
88.
world society
subject term
4
1.
Baltic Atherosclerosis Society
2.
European Society of Hypertension
3.
International Peatland Society
4.
International Society for Engineering Pedagogy (IGIP)
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