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Electron Devices Society (publisher)
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book article
Design error localization in digital circuits by stuck-at fault test patterns
Jutman, Artur
;
Ubar, Raimund-Johannes
[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 2
2000
/
p. 723-726
https://ieeexplore.ieee.org/document/838792
book article
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keyword
85
1.
Auger electron spectroscopy
2.
electron
3.
electron backscatter diffraction (EBSD)
4.
electron backscattered diffraction analysis
5.
electron beam induced current
6.
electron beam melting
7.
Electron beams
8.
electron density measurement
9.
electron donor number
10.
electron donor-acceptor complex
11.
electron guns
12.
electron holography
13.
electron irradiation
14.
electron linear accelerator
15.
electron microscopeGrain sizeHolocene Thermal MaximumBaltic SeaGulf of Riga
16.
electron microscopy
17.
electron phonon interaction
18.
electron tomography
19.
electron transport layer
20.
electron transport layers
21.
electron transporting materials
22.
electron-phonon interaction
23.
lone pair electron
24.
scanning electron microscope
25.
scanning electron microscopy
26.
selective electron beam melting
27.
single electron transfer
28.
TiO2 electron transport layer
29.
transmission electron microscopy
30.
acoustic devices
31.
bi-directional fault monitoring devices
32.
biomedical devices
33.
cardiac implantable electronic devices
34.
cardiac implanted electronic devices
35.
chirality devices
36.
constrained devices
37.
electronic devices
38.
embedded devices
39.
energy storage devices
40.
FACTs devices
41.
GaAs power devices
42.
homecare medical devices
43.
implanted devices
44.
In vitro diagnostic medical devices
45.
intelligent electronic devices
46.
lab-on-chip devices
47.
medical devices
48.
microfluidic devices
49.
miniaturized devices
50.
on-scene available devices
51.
peripheral devices
52.
power devices
53.
power semiconductor devices
54.
resource-constrained devices
55.
semiconductor devices
56.
series Protection devices
57.
smart autonomous devices
58.
smart devices
59.
testing of digital devices
60.
thermoelectric devices
61.
wearable devices
62.
wide band gap semiconductor devices
63.
ageing society
64.
civil society
65.
civil-society
66.
Community Statistics on Information Society (CSIS)
67.
digital economy and society index (DESI)
68.
digital society
69.
energy and society
70.
European Society of Cardiology
71.
European Society of hypertension
72.
harmony society
73.
Ict and society
74.
information society
75.
innovative society
76.
Internet society
77.
law and society
78.
logic in society
79.
open society
80.
science-policy-society interface
81.
society
82.
society-in-the-loop framework
83.
stateless society
84.
The International Society For Engineering Pedagogy
85.
world society
subject term
4
1.
Baltic Atherosclerosis Society
2.
European Society of Hypertension
3.
International Peatland Society
4.
International Society for Engineering Pedagogy (IGIP)
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