Searching - TalTech Research Portal

ETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest (source)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publications ..

year

year of publication

Loading..

Loading..

TalTech department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

export all inquiry results (1)
Save TXT fail

print
Open for editing with marked entries my bookmarks

display

sort
1

book article

Fast static compaction of test sequences using implications and greedy searchRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest2001 / p. 207-209 : ill https://www.semanticscholar.org/paper/Fast-Static-Compaction-of-Test-Sequences-using-and-Raik-Jutman/3a7a8ddda6e63d3e2fde0c8650d4518851746221

book article

Number of records 1, displaying 1 - 1