Fast static compaction of test sequences using implications and greedy search
statement of authorship
J.Raik, A.Jutman, R.Ubar
source
ETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest
location of publication
[S. l.]
year of publication
pages
p. 207-209 : ill
notes
Bibliogr.: 13 ref
language
inglise
subject term
Raik, J., Jutman, A., Ubar, R.-J. Fast static compaction of test sequences using implications and greedy search // ETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest. [S. l.], 2001. p. 207-209 : ill.