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Improved testability calculation for digital circuits (title)
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book article
Improved testability calculation for digital circuits
Ubar, Raimund-Johannes
;
Heinlaid, J.
;
Raun, L.
19th NORCHIP Conference, Kista, Sweden, 12-13 November 2001 : proceedings
2001
/
p. 264-270 : ill
book article
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keyword
8
1.
digital circuits
2.
digital circuits and systems
3.
Multi-valued Simulation for Hazard Detection in Digital Circuits
4.
Structural Decision Diagrams for Modeling Digital Circuits
5.
design for testability
6.
design-for-testability
7.
testability
8.
testability analysis
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