Ubar, R.-J., Heinlaid, J., Raun, L. - TalTech Research Portal

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Improved testability calculation for digital circuits

author

Ubar, Raimund-Johannes

Heinlaid, J.

Raun, L.

statement of authorship

R. Ubar, J. Heinlaid, L. Raun

source

19th NORCHIP Conference, Kista, Sweden, 12-13 November 2001 : proceedings

location of publication

[S.l.]

year of publication

2001

pages

p. 264-270 : ill

ISBN

87-982637-3-0

notes

Bibliogr.: 11 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

digitaalintegraallülitused

arvutusmeetodid

Ubar, R.-J., Heinlaid, J., Raun, L. Improved testability calculation for digital circuits // 19th NORCHIP Conference, Kista, Sweden, 12-13 November 2001 : proceedings. [S.l.], 2001. p. 264-270 : ill.