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Improved testability calculation for digital circuits

author
Ubar, Raimund-Johannes
Heinlaid, J.
Raun, L.
statement of authorship
R. Ubar, J. Heinlaid, L. Raun
source
19th NORCHIP Conference, Kista, Sweden, 12-13 November 2001 : proceedings
location of publication
[S.l.]
year of publication
2001
pages
p. 264-270 : ill
subject term
digitaalintegraallülitused
arvutusmeetodid
ISBN
87-982637-3-0
notes
Bibliogr.: 11 ref
language
inglise
Ubar, R.-J., Heinlaid, J., Raun, L. Improved testability calculation for digital circuits // 19th NORCHIP Conference, Kista, Sweden, 12-13 November 2001 : proceedings. [S.l.], 2001. p. 264-270 : ill.