Searching - TalTech Research Portal

4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 2003 (source)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publications ..

year

year of publication

Loading..

Loading..

TalTech department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

export all inquiry results (1)
Save TXT fail

print
Open for editing with marked entries my bookmarks

display

sort
1

book article

New method of testability calculation to guide RT-level test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-Johannes4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 20032003 / p. 46-51 : ill https://link.springer.com/article/10.1007/s10836-005-5288-5

book article

Number of records 1, displaying 1 - 1