New method of testability calculation to guide RT-level test generation
statement of authorship
Jaan Raik, Tanel Nõmmeots, Raimund Ubar
source
4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 2003
location of publication
[S. l.]
year of publication
pages
p. 46-51 : ill
notes
Bibliogr.: 12 ref
Raik, J., Nõmmeots, T., Ubar, R.-J. New method of testability calculation to guide RT-level test generation // 4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 2003. [S. l.], 2003. p. 46-51 : ill.