LATW 2005 : 6th IEEE Latin-American Test Workshop : March 30 - April 2, 2005, Salvador, Bahia, Brazil : [digest of papers] (source)

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    Deterministic defect-oriented test generation for combinational circuitsRaik, Jaan; Ubar, Raimund-Johannes; Sudbrock, Joachim; Kuzmicz, Wieslaw; Pleskacz, Witold A.LATW 2005 : 6th IEEE Latin-American Test Workshop : March 30 - April 2, 2005, Salvador, Bahia, Brazil : [digest of papers]2005 / p. 325-330 : ill
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