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DefSim: measurement environment for CMOS defects (title)
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DefSim: measurement environment for CMOS defects
Borejko, Tomasz
;
Jutman, Artur
;
Pleskacz, Witold A.
;
Ubar, Raimund-Johannes
2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 2
2006
/
p. 679-682
https://ieeexplore.ieee.org/document/1651048
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CMOS
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CMOS integrated circuits
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CMOS scaling
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