DefSim: measurement environment for CMOS defects
statement of authorship
T.Borejko, A.Jutman, W.A.Pleskacz, R.Ubar
source
2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 2
location of publication
[Niš]
year of publication
pages
p. 679-682
language
inglise
Borejko, T., Jutman, A., Pleskacz, W.A., Ubar, R.-J. DefSim: measurement environment for CMOS defects // 2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 2. [Niš], 2006. p. 679-682.