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Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico (source)
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book article
A scalable static test set compaction method for sequential circuits
Aleksejev, Igor
;
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico
2008
/
p. 87-92 : ill
book article
2
book article
Built-in self diagnosis with multiple signature analyzers in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico
2008
/
p. 29-34 : ill
book article
3
book article
PSL assertion checking with temporally extended high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico
2008
/
p. 49-54 : ill
book article
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