A scalable static test set compaction method for sequential circuits
statement of authorship
Igor Aleksejev, Jaan Raik, Artur Jutman, Raimund Ubar
location of publication
[S.l.]
year of publication
pages
p. 87-92 : ill
notes
Bibliogr.: 17 ref
Aleksejev, I., Raik, J., Jutman, A., Ubar, R.-J. A scalable static test set compaction method for sequential circuits // Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico. [S.l.], 2008. p. 87-92 : ill.