About robustness of test patterns regarding multiple faults
statement of authorship
Raimund Ubar, Sergei Kostin, Jaan Raik
location of publication
[S.l.]
publisher
year of publication
pages
p. 86-91 : ill
conference name, date
LATW 2012: 13th Latin-American Test Workshop, April 10-13, 2012
conference location
Quito, Ecuador
ISBN
978-1-4673-2356-7
notes
Bibliogr.: 37 ref
language
inglise
subject term
Ubar, R., Kostin, S., Raik, J. About robustness of test patterns regarding multiple faults // LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador. [S.l.] : IEEE, 2012. p. 86-91 : ill.