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26376

journal article

Fault effect reasoning in digital systems by topological view on low- and high-level decision diagramsUbar, Raimund-JohannesВестник Томского государственного университета. Управление, вычислительная техника и информатика2014 / p. 99-113 : ill http://journals.tsu.ru/informatics/&journal_page=archive&id=923&article_id=12107

journal article

26377

book article

Fault emulation on FPGA : a feasibility studyEllervee, Peeter; Raik, Jaan; Tihhomirov, ValentinIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 92-95 : ill https://www.researchgate.net/publication/246171898_Fault_Emulation_on_FPGA_A_Feasibility_Study

book article

26378

book article

Fault locating in unearthed MV networks based on analysis of wave transientsJärvik, Jaan; Panov, ValeriThe 4th International Conference Electric Power Quality and Supply Reliability : August 29...31, 2004, Pedase, Estonia : proceedings2004 / p. 163-168

book article

26379

book article

Fault management instrumentation network based on IEEE P1687 IJTAGShibin, Konstantin; Jutman, Artur; Devadze, SergeiEuropean Test Symposium (ETS), 2013, Avignon, France2013

book article

26380

journal article EST / journal article ENG

Fault management techniques to enhance the reliability of power electronic converters : an overviewRahimpour, Saeed; Husev, Oleksandr; Vinnikov, Dmitri; Vosoughi Kurdkandi, Naser; Tarzamni, HadiIEEE Access2023 / p. 13432-13446 https://doi.org/10.1109/ACCESS.2023.3242918 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

26381

book article

Fault model and test synthesis for RISC-processorsUbar, Raimund-Johannes; Markus, Antti; Jervan, Gert; Raik, JaanBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 229-232: ill

book article

26382

book article

Fault modeling and diagnosis in digital systemsUbar, Raimund-JohannesCREDES Summer School : Dependable Systems Design : handouts2011 / p. 91-106 : ill

book article

26383

book article

Fault modeling and test generation with low- and high-level decision diagramsUbar, Raimund-Johannes24. GI/GMM/ITG-Workshop : Testmethoden und Zuverlässigkeit von Schaltungen und Systemen2012 / p. 1-12

book article

26384

book article

Fault oriented test pattern generation for sequential circuits using Genetic AlgorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 129-132 : ill

book article

26385

book article

Fault oriented test pattern generation for sequential circuits using genetic algorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 319-320

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26386

book article

Fault path detection using a spectral methodPorwik, PiotrBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 315-318: ill

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26387

book article

Fault prediction in power networkKangilaski, TaivoThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 289-292

book article

26388

dissertation

Fault simulation and code coverage analysis of RTL designs using high-level decision diagrams = Rikete simuleerimine ja koodikatte analüüs register-siirde tasemel kasutades kõrgtaseme otsustusdiagrammeReinsalu, Uljana2013 https://www.ester.ee/record=b2963595*est

dissertation

26389

dissertation

Fault simulation of digital systems = Digitaalsüsteemide rikete simuleerimineDevadze, Sergei2009 https://digi.lib.ttu.ee/i/?445 https://www.ester.ee/record=b2508727*est

dissertation

26390

book article

Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDsDevadze, Sergei; Raik, Jaan; Jutman, Artur; Ubar, Raimund-Johannes7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings2006 / p. 97-102 : ill

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26391

book article

Fault simulation with parallel exact critical path tracing in multiple core environmentGorev, Maksim; Ubar, Raimund-Johannes; Devadze, SergeiProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 9-13 March 2015, Grenoble, France2015 / p. 1180-1185 : ill

book article

26392

journal article

Fault tolerance in integration interfaces of business softwareLemmik, Rivo; Karjust, Kristo; Otto, TaunoInternational Journal Of Scientific Knowledge (Computing and Information Technology) IJSK2014 / p. 35-43 : ill

journal article

26393

book article

Fault tolerant control of a grid-connected microgrid with high penetration of renewable energySenanayaka, Jagath; Khang, Huynh Van; Vaimann, Toomas; Rassõlkin, Anton24th International Conference on Electrical Machines and Systems (ICEMS)2021 / p. 938-943 https://doi.org/10.23919/ICEMS52562.2021.9634364

book article

26394

book article

Fault tree generation from the processKaraulova, Tatjana; Papstel, JüriAnnals of DAAAM for 2004 & proceedings of the 15th International DAAAM Symposium "Intelligent Manufacturing & Automation : Globalisation - Technology - Men - Nature" : 3-6th November 2004, Vienna, Austria2004 / p. 199-200 : ill

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26395

book article

Fault-aware performance assessment approach for embedded networksMalburg, Jan; Janson, Karl; Raik, Jaan; Dannemann, Frank2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 4 p. : ill https://doi.org/10.1109/DDECS.2019.8724670

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26396

book article

Fault-resilient NoC router with transparent resource allocationPutkaradze, Tsotne; Azad, Siavoosh Payandeh; Niazmand, Behrad; Raik, Jaan; Jervan, Gert12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill https://doi.org/10.1109/ReCoSoC.2017.8016161 https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8016161

book article

26397

journal article

A fault-resistant architecture for AES S-box architectureTaheri, Mahdi; Sheikhpour, Saeideh; Ansari, Mohammad Saeed; Mahani, AliJournal of Applied Research in Electrical Engineering2021 / p. 86-92 https://doi.org/10.22055/jaree.2021.36230.1020

journal article

26398

book article

Faults and fault models for integrated circuits and systems [Electronic resource] : [slides]Ubar, Raimund-JohannesDesign and Test Technology for Dependable Hardware/Software Systems : DEDIS/DAAD Summer Academy : BTU Cottbus, Sept. 1st-12th, 20082008 / [64] p. : ill. [CD-ROM]

book article

26399

book article

Fault-tolerant approach for photovoltaic module-level power electronic applicationsVinnikov, Dmitri; Chub, Andrii; Korkh, Oleksandr; Malinowski, Mariusz2020 IEEE 14th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG) : proceedings2020 / p. 438-444 : ill https://doi.org/10.1109/CPE-POWERENG48600.2020.9161599

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26400

book article

Fault-tolerant bidirectional series resonant DC-DC converter with minimum number of componentsVinnikov, Dmitri; Chub, Andrii; Korkh, Oleksandr; Malinowski, Mariusz2019 IEEE Energy Conversion Congress and Exposition, ECCE, 2019-09-29 - 2019-10-03, Baltimore, MD, USA2019 / p. 1359–1363 https://doi.org/10.1109/ECCE.2019.8912292

book article

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