IEEE 1687 compliant ecosystem for embedded instrumentation access and in-field health monitoring

statement of authorship
Anton Tsertov, Artur Jutman, Konstantin Shibin, Sergei Devadze
location of publication
Piscataway
publisher
year of publication
pages
9 p.: ill
conference name, date
IEEE AUTOTESTCON 2018, National Harbor, September 17-20, 2018
conference location
Maryland, USA
subject of form
ISSN
1558-4550
ISBN
978-1-5386-5223-7
notes
Bibliogr.: 13 ref
TTÜ department
language
inglise
Tšertov, A., Jutman, A., Shibin, K., Devadze, S. IEEE 1687 compliant ecosystem for embedded instrumentation access and in-field health monitoring // IEEE AUTOTESTCON 2018 : National Harbor, September 17-20, 2018 : proceedings. Piscataway : IEEE, 2018. 9 p.: ill. https://doi.org/10.1109/AUTEST.2018.8532559