Measuring and identifying aging-critical paths in FPGAs

statement of authorship
Petr Pfeifer, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Zdenek Pliva
location of publication
[S.l.]
publisher
year of publication
pages
p. 56-61 : ill
conference name, date
4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, March 13, 2015
conference location
Grenoble, France
keyword
critical path
LUT
BRAM
notes
Bibliogr.: 14 ref
TTÜ department
language
inglise
Pfeifer, P., Raik, J., Jenihhin, M., Ubar, R., Pliva, Z. Measuring and identifying aging-critical paths in FPGAs // MEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France. [S.l.] : COST, 2015. p. 56-61 : ill.