NoCDepend : a flexible and scalable dependability technique for 3D networks-on-chip
statement of authorship
Thomas Hollstein, Siavoosh Payandeh Azad, Thilo Kogge, Haoyuan Ying, Klaus Hofmann
location of publication
Los Alamitos
publisher
year of publication
pages
p. 75-78 : ill
conference name, date
18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015, 22-24 April 2015
conference location
Belgrade, Serbia
ISBN
978-1-4799-6780-3
notes
Bibliogr.: 17 ref
TTÜ department
language
inglise
subject term
Hollstein, T., Azad, S.P., Kogge, T., Ying, H., Hofmann, K. NoCDepend : a flexible and scalable dependability technique for 3D networks-on-chip // 2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings. Los Alamitos : IEEE Computer Society, 2015. p. 75-78 : ill.